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SSH EN 60749-26:2006

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Jun 6, 2008
95.99 Withdrawal of Standard   May 30, 2017

General information

95.99     May 30, 2017

DPS

DPS/KT 7

European Norm

31.080.01  

English  

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-26:2006
95.99 Withdrawal of Standard
May 30, 2017

REVISED BY

WITHDRAWN
SSH EN 60749-26:2014

Related project

Adopted from EN 60749-26:2006

Adopted from IEC 60749-26 Ed. 2.0 b