Published
This document describes methods for the measurement of the thickness of coatings by means of thermal waves generated by a radiation source.
The method can be used for coatings whose thermal properties (e.g. thermal conductivity) are different from those of the substrates in a range from a few microns to some hundred microns.
PUBLISHED
SSH EN 15042-2:2006
60.60
Standard published
May 10, 2007
Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.