This standard outlines the basic procedures applied in the X-ray Powder Diffraction (XRPD) method. Many of these procedures are common to most types of diffractometer used and type of analysis mentionen in prEN WI 00138079 (General Principles). In the interests of clarity and immediate usability more detail is given for procedures using instruments with Bragg-Brentano geometry and application to phase identification. Aspects of specimen preparation and data quality assessment are included, but the standard remains non-exhaustive.
Life cycle
NOW
PUBLISHED SSH EN 13925-2:2003 60.60
Standard published Jan 1, 2006
Related project
Adopted from
EN 13925-2:2003
Preview
Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.
Shqip