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SSH EN 60749-32:2003

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Dec 18, 2006

General information

60.60     Jan 1, 2006

DPS

DPS/KT 3

European Norm

31.080.01  

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

Life cycle

NOW

PUBLISHED
SSH EN 60749-32:2003
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-32:2003

Adopted from IEC 60749-32 Ed. 1.0 b