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Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
60.60 Standard published
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
60.60 Standard published
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
60.60 Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
60.60 Standard published
Industrial platinum resistance thermometers and platinum temperature sensors
60.60 Standard published
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
60.60 Standard published
Amendment 1 - Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
60.60 Standard published
Corrigendum 1 - Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
60.60 Standard published
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
60.60 Standard published
Amendment 1 - Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
60.60 Standard published
Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography
60.60 Standard published
General safety requirements for residual current operated protective devices
60.60 Standard published
General safety requirements for residual current operated protective devices - Part 1: Residual current operated protective devices for DC systems
60.60 Standard published
Non-broadcast video tape recorders - Time base stability
60.60 Standard published
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