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Produkte kimike të lëngshme për përdorim industrial - Përcaktimi i dendësisë në shkallën 20 C
60.60 Standard published
Lëngjet organike flurore për përdorim industrial - Përcaktimi i mbetjes së thatë pas avullimit në pajisjen laboratorike banjo me ujë - Metoda e përgjithshme
60.60 Standard published
Produkte kimike për përdorim industrial - Teknikat e marrjes së mostrës - Produkte kimike të ngurta me grimca që variojnë nga pluhur deri me granulometri të trashë
60.60 Standard published
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
90.60 Close of review
Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
90.93 Standard confirmed
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
60.60 Standard published
Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
90.93 Standard confirmed
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
90.93 Standard confirmed
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
90.93 Standard confirmed
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
90.93 Standard confirmed
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration — Amendment 1: Correction to Formula 5
60.60 Standard published
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
90.93 Standard confirmed
Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
60.60 Standard published
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
90.93 Standard confirmed
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
90.93 Standard confirmed
Gas analysis — General quality aspects and metrological traceability of calibration gas mixtures
90.93 Standard confirmed
Surface chemical analysis — Characterization of nanostructured materials
60.60 Standard published
English