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prSSH EN IEC 63287-2:2024

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

General information

10.00     Nov 11, 2024

DPS

European Norm

31.080.01  

Scope

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Life cycle

NOW

IN_DEVELOPMENT
prSSH EN IEC 63287-2:2024
10.00 Proposal for new project registered
Nov 11, 2024

Related project

Adopted from EN IEC 63287-2:2023 IDENTICAL

Adopted from IEC 63287-2:2023 ED1 IDENTICAL