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Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
60.60 Standard published
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
60.60 Standard published
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
60.60 Standard published
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
60.60 Standard published
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
60.60 Standard published
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
60.60 Standard published
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
60.60 Standard published
Piezoelectric sensors - Part 1: Generic specifications
60.60 Standard published
Piezoelectric sensors - Part 2: Chemical and biochemical sensors
60.60 Standard published
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
60.60 Standard published
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods
60.60 Standard published
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